亚洲熟妇激情视频91_色网站在线看_三级理论片久久搜索_97色色五月婷婷_2020国产精品无码_亚洲人妻av在线播放_三大黑人大战波多野结衣免费_日日做夜夜欢狠狠免费软件_AV怡红院av怡春院院AV_日韩精品A 免费一区二区

Welcome to Wuhan Yoha Solar Technology Co., Ltd!

common problem Site Map Language: Chinese English

Common defects in photovoltaic module EL defect detector testing battery modules

time:2023-04-13
Number of hits:0
Firstly, let's take a look at what photovoltaic module EL detection equipment is: EL detectors are used to detect hidden cracks in solar modules. Without them, internal defects cannot be detected. This equipment is essential for both assembly line production and on-site photovoltaic power plants.

Common defects: Detection of internal defects in components, such as broken grids, hidden cracks, fragments, fragments, solder joints, sintered mesh patterns, black cores, black edges, mixed grades, inefficient chips, edge etching, PID, attenuation, hot spot attenuation, etc.

Photovoltaic module EL defect detector

The full English name for EL is Electro Luminescence, which means electroluminescence, also known as electroluminescence detection. The near-infrared image of crystalline silicon is taken by using the electroluminescence principle of crystalline silicon and the high-resolution infrared camera. The obtained image is analyzed and processed by the image software to determine the defects of solar cells, photovoltaic modules, etc.
At present, EL detection is applied in the photovoltaic industry, such as defect detection of photovoltaic modules, internal defect detection of solar cells, and hidden crack detection of silicon wafers. The use of portable EL detectors in photovoltaic modules and power plants can adapt to different environments and locations, facilitating rapid identification and judgment of internal defects generated by photovoltaic modules.

In the production of solar cells, EL detectors can be applied to the solar cell unit to identify internal defects that are not easily recognized by machine vision systems, such as black centers, black spots, broken grids, hidden cracks, fragments, and other defects. In the selection of battery cells and silicon wafers, ordinary defects and colors can be identified and judged through machine vision systems. However, for some internal defects, the system is difficult to identify or easy to miss, which leads to misjudgment or low sorting efficiency of sorting equipment. The current EL detector technology can identify, judge, and sort positive and negative defects, colors, and internal defects of battery cells. The detection speed has reached the same international level, and the detection efficiency has greatly improved.
keywords: